Field Analytical Chemistry and Technology   3(1)   1999 55-66.

Albert Robbat Jr. and Sigurdur Smarason

Department of Chemistry, Tufts University, Medford, Massachusetts 02155

Yuri Gankin

Ion Signature Technology, P.O. Box 636, Cambridge, Massachusetts 02238

Abstract

A new data analysis software system (Ion Fingerprint Detection ^TM) has been developed to provide fast mass spectral data analysis.  Methods have been developed that can provide screening to quantitative gas chromatography/mass spectrometry (GC/MS) data in 30 s to minutes.  Compound selectivity is provided through a unique set of algorithms rather than GC separation.  The data quality produced for volatile and semivolatile organic contaminants under fast GC/MS conditions during dynamic site investigations carried out at Hanscom Air Force Base (Bedford, MA) and Joliet Army Ammunition Plant (Joliet, IL) are discussed.  More than 800 samples were analyzed in each project, with state and federal regulators accepting the data to complete remedial investigation/feasibility (RI/FS) studies.  1999 John Wiley & Sons, Inc.